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Northampton Chronicle & Echo on MSN3h
Students show-off need for speed with games design challenge at Silverstone MuseumThe next generation of video game creators have battled it out to be crowned victors during University of Northampton’s ...
Abstract: This article describes new concepts and algorithms used to generate tests for VLSI scan-design circuits. The new algorithms include: 1. a low-cost fault-independent algorithm (SMART), 2. a ...
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