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Tech Xplore on MSNImage-based model enhances the detection of surface defects in low-light industrial settingsIn industry, the detection of anomalies such as scratches, dents, and discolorations is crucial to ensure product quality and ...
A research team at Tohoku University's Advanced Institute for Materials Research (WPI-AIMR) has developed a new technique to ...
A team of McGill University researchers has developed a cost-effective, high-throughput technology for detecting nanoplastics ...
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