After earlier explaining how to compute disorder and split data in his exploration of machine learning decision ... Console.WriteLine("Classification accuracy = " + acc.ToString("F4")); The ...

[1] Z. Li, Z. Wang and W. Shi, “Automatic Wafer Defect Classification Based on Decision Tree of Deep Neural Network,” IEEE ASMC, May 2022. [1] Y.F. Chang, et. al., “Machine Learning Assists on High ...