Three well-known algorithms for the automatic test pattern generation (ATPG) for digital circuits are the D algorithm, Podem, and Fan. The author introduces the concept of test generation and analyzes ...

One way to test random number generator algorithms is to use statistical tests that measure various properties of the generated numbers, such as frequency, runs, gaps, correlations, and patterns.

Learn how AI algorithms can perform pattern recognition by using different techniques, such as supervised, unsupervised, semi-supervised, and reinforcement learning, and what are the benefits and ...

Often times, pattern generators are handy and a good fit for semiconductor electrical testing, as a digital system controller running through user defined control algorithms, as well as a ...

Three well-known algorithms for the automatic test pattern generation (ATPG) for digital circuits are the D algorithm, Podem, and Fan. The author introduces the concept of test generation and analyzes ...