Three well-known algorithms for the automatic test pattern generation (ATPG) for digital circuits are the D algorithm, Podem, and Fan. The author introduces the concept of test generation and analyzes ...

One way to test random number generator algorithms is to use statistical tests that measure various properties of the generated numbers, such as frequency, runs, gaps, correlations, and patterns.

The quality of patterns discovered in data mining is heavily influenced by the chosen algorithm. High-quality patterns are accurate, interpretable, and generalizable.

Often times, pattern generators are handy and a good fit for semiconductor electrical testing, as a digital system controller running through user defined control algorithms, as well as a ...

One AudioCraft model, MusicGen, analysed patterns in some 400,000 recordings with a collective duration of almost 28 months to come up with 3.3bn “parameters”, or variables, that enables the ...

Three well-known algorithms for the automatic test pattern generation (ATPG) for digital circuits are the D algorithm, Podem, and Fan. The author introduces the concept of test generation and analyzes ...