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Semiconductor Engineering5mon
Wafer Bin Map Defect Classification Using Semi-Supervised Learning
A new technical paper titled “Semi-Supervised Learning with Wafer-Specific Augmentations for Wafer Defect Classification” was published by researchers at Korea University. “Semi-supervised learning ...
Business Wire4mon
OKI Develops ‘Ship Classification AI System Technology’ to Classify Ships Through Deep Learning of Underwater Sounds
TOKYO--(BUSINESS WIRE)--OKI (TOKYO: 6703) has developed ‘ship classification ... supervised learning, which trains the model using ship sound information from partial data. As a result, the ...