In logic, the inspection and metrology steps are conducted throughout the process flow. The same is true for SiC. “Generally, wafer defect inspection is necessary for the status of the seed crystal ...

Researchers are rolling out a new manufacturing process and chip design for silicon carbide (SiC) ... Power devices consist of a diode and transistor, and are used to regulate the flow of power in ...

Researchers are rolling out a new manufacturing process and chip design for silicon carbide (SiC) ... Power devices consist of a diode and transistor, and are used to regulate the flow of power in ...

SiC diodes, in particular, ... The additional expenses to accommodate handling of smaller wafers in the manufacturing process flow drives up costs for devices. With the advent of 150-mm diameter SiC ...

Diodes has expanded its silicon carbide (SiC) product portfolio with a series of five high-performance, low figure-of-merit (FOM) 650V SiC Schottky diodes. Diodes unveils new SiC Schottky diodes ...

PLANO, Texas, April 15, 2025--Diodes Incorporated (Diodes) (Nasdaq: DIOD) today announces the expansion of its silicon carbide (SiC) product portfolio with a series of five high-performance, low ...

Vishay Intertechnology VSH recently launched Gen 3 1200 V silicon carbide (SiC) Schottky diodes. The diodes boast high surge current robustness, low forward voltage drop, capacitive charge, and ...

Suppression of stacking-fault expansion in 4H-SiC PiN diodes using proton implantation to solve bipolar degradation. Scientific Reports , 2022; 12 (1) DOI: 10.1038/s41598-022-23691-y Cite This Page : ...

Diodes Incorporated (Diodes) (Nasdaq: DIOD) today announces the expansion of its silicon carbide (SiC) product portfolio with a series of five high-performance, low figure-of-merit (FOM) 650V SiC ...