Identify early indicators of risk by analyzing timing margin data from within the chip.

Pseudo-random testing patterns are inadequate for meeting the stringent requirements of automotive electronics.

Determine how much development time you have allocated to address the test need. The out-of-box experience may be critical if you don't have time to study how to configure and program the pattern ...

In the past, the automatic test pattern generator (ATPG) program filled these bits with random 1s and 0s, but the vectors still had to be stored in the ATE memory. Test vector volume reduction ...

This means that when translating these patterns into an actual test program for ATE, a mapping must be done by the translation tool because real device test programs must have shift data. It is this ...

In 2024, we are celebrating 75 years on the air. October 15 is the anniversary of the first time we showed a test pattern on TV and the first time an image was shown on TV ever in Tulsa.