There's exactly one hit on google for the same "t/io_udp6.....FAILED test 5" error I got, but no solution. Where do I begin to try to tackle this one? Or could I just ...

Test sockets with the new conduction-cooling system are suitable ... TECs can heat and cool with the same module depending on the polarity of the dc power supply while providing precise temperature ...

Test and burn-in of integrated circuits can be performed by a new socket that accommodates packages from 41 mm2 to 55 mm2. This covers ICs such as SRAMs, DRAMs, DSPs and flash memories.

Wells-CTI is offering an IC test socket shield for devices requiring ultra-sensitive testing. The shield works with nearly all of the company's test sockets and provides a removable barrier against ...