Defect detection in material micro-images has a significant impact on the study of the relationship between the micro-structure and macro-properties, however, material microdefects are usually ...

This model is trained using the above dataset and is then used to classify new images with an accuracy of roughly 94%. This work also proposes a detect classification method which can identify the ...

Silicon wafer is the raw material of semiconductor chip. It is important and challenging to research a fast and accurate method of identifying and classifying wafer structural defects. To this end, we ...

Run example notebooks in Google Colab: Make predictions of image F1 score with Random forest model and object predictions with Mask R-CNN using final model fit to all data. This model was trained on ...